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Surface Particle Scanner - List of Manufacturers, Suppliers, Companies and Products

Surface Particle Scanner Product List

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Wafer Surface Particle Scanner YPI-MX

Wafer Surface Particle Scanner YPI-MX

Standard device for non-patterned transparent and semi-transparent wafer surface particles!

In addition to silicon wafers, double-polished transparent wafers and single-side polished translucent wafers (back matte wafers) can also be measured. You can choose between automatic transport specifications and manual transport specifications. There is an option for microscope observation that allows for review after measurement.

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Wafer Surface Particle Scanner YPI-MX-DC

Wafer Surface Particle Scanner YPI-MX-DC

Next-generation power semiconductor wafer particle inspection equipment for SiC/GaN.

Non-patterned SiC bulk wafer 0.1μm detection. Detection of micro-scratches. Ideal for confirming the cleaning of SiC and GaN wafers. Automatic and manual transport options are available. Microscopic observation function allows for review after measurement.

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Wafer Surface Particle Scanner YPI-MN

Wafer Surface Particle Scanner YPI-MN

A compact and space-saving tabletop particle inspection device ideal for device development and wafer cleaning checks!

It is a non-pattern wafer and substrate surface particle inspection device. It is a manual transport tabletop inspection device that does not take up much space. It is easy to install in labs or next to equipment. It can measure not only silicon but also glass materials.

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